1. AOI外觀檢查機 AOI appearance inspection machine

♦ 機型：HJ-CPAA-100 ( Model No.:HJ-CPAA-100 )

ㄧ、機台說明  Product Description 

此機台是晶片外觀瑕疵檢測設備。自動檢查晶片正面 & 端面瑕疵，依使用者晶片不同，可做大面積外觀 & 小面積高倍瑕疵檢查，晶片入 / 出料方式可依使用者需求搭配選擇 Ring / gel-pak / wafer-pak，AOI 自動追焦系統,可避免景深造成誤判。

This machine is a Chip appearance inspection machine. The inspection device can automatically check the front and end faces of the Chip.The device can be used for large-area appearance and small-area high-spectrum inspection depending on the user's Chip.Chip feeding and discharging methods can be selected according to the user Ring/gel-pak/wafer-pak.AOI automatic tracking system can avoid false positives caused by depth of field.

二、產品特性 Product Features

♦塑料吸嘴，避免吸取時損傷晶片。

♦The plastic nozzles avoid damage to the chip during drawing.

♦吸嘴彈力均 <20g。

♦The nozzle elasticity <20 g.

♦線性馬達位移控制，超靜音，搭配光學尺精準度高。

♦The linear motor displacement control is very quiet and the optical ruler has high precision.

♦3 組 AOI 瑕疵檢查系統，可進行正面外觀 100x / 正面細部 200x / 端面細部 500x 多面檢測。

♦3 groups of AOI defect detection systems can be used for front appearance 100x / front detail 200x / end faces detail 500x multifaceted inspection.

♦旋轉檢測功能，可進行晶片多面檢測

♦Rotation detection for Chip multi-face inspection.

♦晶片入 / 出料方式可依使用者需求搭配選擇 Ring / gel-pak / wafer-pak。

♦The wafer feeding and discharging method can be selected according to the user's Ring/gel-pak/wafer-pak.

♦5 百萬畫素相機搭配 AOI 自動追焦系統，可避免景深造成誤判。

♦The device's 5 megapixel camera has an AOI auto-focusing system that avoids false positives caused by depth of field.

♦檢查項目：水波紋 / 鍍膜脫落 / 空洞 / Particles / Contamination / Broken。

♦Inspection item: water ripple / coating peeling / cavity /Particles/Contamination/Broken.

♦依照瑕疵檢測結果進行分類，方便重複確認。

♦According to the defect detection result, it is convenient to repeat the confirmation.

♦標配 HEPA 過濾 & 靜電風扇。

♦The device has HEPA filters and an electrostatic fan.

♦全機 IPC 控制，操作介面清楚直覺。

♦Full IPC control, clear operation interface.

三、產品規格 Product Specifications